Method of determination of AlGaAsSb layer composition in molecular beam epitaxy processes with regard to unintentional As incorporation

K. Regiński, R. Jakieła, A. Jasik, J. Kubacka-Traczyk, I. Sankowska, A. Wawro, J. Kaniewski
  • Journal of Applied Physics, January 2011, American Institute of Physics
  • DOI: 10.1063/1.3642995
The author haven't yet claimed this publicationThe author haven't yet claimed this publication