Defect distributions in thin film solar cells deduced from admittance measurements under different bias voltages

Koen Decock, Samira Khelifi, Stephan Buecheler, Fabian Pianezzi, Ayodhya N. Tiwari, Marc Burgelman
  • Journal of Applied Physics, January 2011, American Institute of Physics
  • DOI: 10.1063/1.3641987
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