Valence band offset of Cu2O/In2O3 heterojunction determined by X-ray photoelectron spectroscopy

C. J. Dong, W. X. Yu, M. Xu, J. J. Cao, C. Chen, W. W. Yu, Y. D. Wang
  • Journal of Applied Physics, January 2011, American Institute of Physics
  • DOI: 10.1063/1.3641637
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