Experimental evidence for exchange bias in polycrystalline BiFeO3/Ni81Fe19 thin films

Tony Hauguel, Souren P. Pogossian, David T. Dekadjevi, David Spenato, Jean-Philippe Jay, Mikhail V. Indenbom, Jamal Ben Youssef
  • Journal of Applied Physics, January 2011, American Institute of Physics
  • DOI: 10.1063/1.3636098
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