Screw threading dislocations in AlN: Structural and electronic properties of In and O doped material

J. Kioseoglou, E. Kalesaki, I. Belabbas, J. Chen, G. Nouet, H. Kirmse, W. Neumann, Ph. Komninou, Th. Karakostas
  • Journal of Applied Physics, January 2011, American Institute of Physics
  • DOI: 10.1063/1.3632985