A highly sensitive evaluation method for the determination of different current conduction mechanisms through dielectric layers

Katsuhisa Murakami, Mathias Rommel, Vasil Yanev, Tobias Erlbacher, Anton J. Bauer, Lothar Frey
  • Journal of Applied Physics, January 2011, American Institute of Physics
  • DOI: 10.1063/1.3631088
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The following have contributed to this page: Dr. Mathias Rommel