Opto-electronic characterization of electron traps upon forming polymer oxide memory diodes

  • Qian Chen, Benjamin F. Bory, Asal Kiazadeh, Paulo R. F. Rocha, Henrique L. Gomes, Frank Verbakel, Dago M. De Leeuw, Stefan C. J. Meskers
  • Applied Physics Letters, August 2011, American Institute of Physics
  • DOI: 10.1063/1.3628301

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http://dx.doi.org/10.1063/1.3628301

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