In situ observation of vacancy dynamics during resistance changes of oxide devices

Sang-Jun Choi, Gyeong-Su Park, Ki-Hong Kim, Woo-Young Yang, Hyung-Jin Bae, Kyung-Jin Lee, Hyung-ik Lee, Seong Yong Park, Sung Heo, Hyun-Joon Shin, Sangbin Lee, Soohaeng Cho
  • Journal of Applied Physics, January 2011, American Institute of Physics
  • DOI: 10.1063/1.3626816
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