Sub-pixel porosity revealed by x-ray scatter dark field imaging

U. Sennhauser, U. Straumann, C. Urban, P. Schütz, T. Lüthi, V. Revol, I. Jerjen, C. Kottler, R. Kaufmann
  • Journal of Applied Physics, January 2011, American Institute of Physics
  • DOI: 10.1063/1.3624592