Electrical properties of ZnO nanorods studied by conductive atomic force microscopy

I. Beinik, M. Kratzer, A. Wachauer, L. Wang, R. T. Lechner, C. Teichert, C. Motz, W. Anwand, G. Brauer, X. Y. Chen, X. Y. Hsu, A. B. Djurišić
  • Journal of Applied Physics, January 2011, American Institute of Physics
  • DOI: 10.1063/1.3623764
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