Downscaling effects on self-heating related instabilities in p-channel polycrystalline silicon thin film transistors

  • A. Valletta, P. Gaucci, L. Mariucci, A. Pecora, L. Maiolo, G. Fortunato
  • Applied Physics Letters, August 2011, American Institute of Physics
  • DOI: 10.1063/1.3621874

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http://dx.doi.org/10.1063/1.3621874

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