Response to the “Comment on ‘Thermal frequency noise in dynamic scanning force microscopy’” [J. Appl. Phys. 110, 036107 (2011)]

J. Colchero, Juan Francisco González Martínez, José Abad, B. Pérez García, M. Cuenca, E. Palacios-Lidón, J. Abellán
  • Journal of Applied Physics, January 2011, American Institute of Physics
  • DOI: 10.1063/1.3619795