Erratum: “Measurement of SiO2/InZnGaO4 heterojunction band offsets by x-ray photoelectron spectroscopy” [Appl. Phys. Lett. 98, 242110 (2011)]

E. A. Douglas, A. Scheurmann, R. P. Davies, B. P. Gila, Hyun Cho, V. Craciun, E. S. Lambers, S. J. Pearton, F. Ren
  • Applied Physics Letters, January 2011, American Institute of Physics
  • DOI: 10.1063/1.3617417