Optical probe of strong correlations in LaNiO3 thin films

M. K. Stewart, Jian Liu, R. K. Smith, B. C. Chapler, C.-H. Yee, R. E. Baumbach, M. B. Maple, K. Haule, J. Chakhalian, D. N. Basov
  • Journal of Applied Physics, January 2011, American Institute of Physics
  • DOI: 10.1063/1.3614019