Evaluation of the interface of thin GaN layers on c- and m-plane ZnO substrates by Rutherford backscattering

  • Y. Izawa, T. Oga, T. Ida, K. Kuriyama, A. Hashimoto, H. Kotake, T. Kamijoh
  • Applied Physics Letters, July 2011, American Institute of Physics
  • DOI: 10.1063/1.3610958

The authors haven't yet claimed this publication.

Read Publication

http://dx.doi.org/10.1063/1.3610958

In partnership with: