Determination of Al molar fraction in AlxGa1-xN films by Raman scattering

J. G. Kim, A. Kimura, Y. Kamei, N. Hasuike, H. Harima, K. Kisoda, Y. Simahara, H. Miyake, K. Hiramatsu
  • Journal of Applied Physics, January 2011, American Institute of Physics
  • DOI: 10.1063/1.3610525