Decomposition pathways in age hardening of Ti-Al-N films

R. Rachbauer, S. Massl, E. Stergar, D. Holec, D. Kiener, J. Keckes, J. Patscheider, M. Stiefel, H. Leitner, P. H. Mayrhofer
  • Journal of Applied Physics, January 2011, American Institute of Physics
  • DOI: 10.1063/1.3610451