Influence of defects on structural and electrical properties of VO2 thin films

Changhong Chen, Yong Zhao, Xuan Pan, V. Kuryatkov, A. Bernussi, M. Holtz, Zhaoyang Fan
  • Journal of Applied Physics, January 2011, American Institute of Physics
  • DOI: 10.1063/1.3609084
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The following have contributed to this page: Professor Zhaoyang Fan