High contrast imaging and thickness determination of graphene with in-column secondary electron microscopy

Vidya Kochat, Atindra Nath Pal, E. S. Sneha, Arjun Sampathkumar, Anshita Gairola, S. A. Shivashankar, Srinivasan Raghavan, Arindam Ghosh
  • Journal of Applied Physics, January 2011, American Institute of Physics
  • DOI: 10.1063/1.3608062