Charge trapping in alumina and its impact on the operation of metal-alumina-nitride-oxide-silicon memories: Experiments and simulations

Andrea Padovani, Luca Larcher, Vincenzo Della Marca, Paolo Pavan, Hokyung Park, Gennadi Bersuker
  • Journal of Applied Physics, January 2011, American Institute of Physics
  • DOI: 10.1063/1.3602999
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