Volume charge carrier number fluctuations probed by low frequency noise measurements in InN layers

  • Geeta Rani Mutta, Jean Marc Routoure, Bruno Guillet, Laurence Méchin, Javier Grandal, Sara Martin-Horcajo, Tommaso Brazzini, Fernando Calle, Miguel A. Sánchez-García, Philippe Marie, Pierre Ruterana
  • Applied Physics Letters, June 2011, American Institute of Physics
  • DOI: 10.1063/1.3601855

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http://dx.doi.org/10.1063/1.3601855

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