Trapping of implanted He at Cu/Nb interfaces measured by neutron reflectometry

  • Mikhail Zhernenkov, Michael S. Jablin, Amit Misra, Michael Nastasi, Yongqiang Wang, Michael J. Demkowicz, Jon K. Baldwin, Jarek Majewski
  • Applied Physics Letters, June 2011, American Institute of Physics
  • DOI: 10.1063/1.3600642

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http://dx.doi.org/10.1063/1.3600642

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