Confocal Raman depth-scanning spectroscopic study of phonon−plasmon modes in GaN epilayers

V. V. Strelchuk, V. P. Bryksa, K. A. Avramenko, M. Ya. Valakh, A. E. Belyaev, Yu. I. Mazur, M. E. Ware, E. A. DeCuir, G. J. Salamo
  • Journal of Applied Physics, January 2011, American Institute of Physics
  • DOI: 10.1063/1.3599892
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