Study of the piezoresistivity of doped nanocrystalline silicon thin films

P. Alpuim, J. Gaspar, P. Gieschke, C. Ehling, J. Kistner, N. J. Gonçalves, M. I. Vasilevskiy, O. Paul
  • Journal of Applied Physics, January 2011, American Institute of Physics
  • DOI: 10.1063/1.3599881
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