Correlation of the change in transfer characteristics with the interfacial trap densities of amorphous In–Ga–Zn–O thin film transistors under light illumination

Jeong Hwan Kim, Un Ki Kim, Yoon Jang Chung, Cheol Seong Hwang
  • Applied Physics Letters, January 2011, American Institute of Physics
  • DOI: 10.1063/1.3597299