X-ray combined analysis of fiber-textured and epitaxial Ba(Sr,Ti)O3 thin films deposited by radio frequency sputtering

D. Rémiens, L. Yang, F. Ponchel, J. F. Légier, D. Chateigner, G. Wang, X. Dong
  • Journal of Applied Physics, January 2011, American Institute of Physics
  • DOI: 10.1063/1.3592282
The author haven't finished explaining this publicationThe author haven't finished explaining this publication

The following have contributed to this page: Full Professor Daniel Chateigner