Nano-engineered defect structures in Ce- and Ho-doped metal-organic chemical vapor deposited YBa2Cu3O6+δ films: Correlation of structure and chemistry with flux pinning performance

T. Aytug, Z. Chen, V. A. Maroni, D. J. Miller, C. Cantoni, E. D. Specht, A. J. Kropf, N. Zaluzec, Y. Zhang, Y. Zuev, M. Paranthaman
  • Journal of Applied Physics, January 2011, American Institute of Physics
  • DOI: 10.1063/1.3592244
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