Paramagnetic Pb-type interface defects in thermal (110)Si/SiO2

  • K. Keunen, A. Stesmans, V. V. Afanas’ev
  • Applied Physics Letters, May 2011, American Institute of Physics
  • DOI: 10.1063/1.3590271

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http://dx.doi.org/10.1063/1.3590271

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