Discerning passivation mechanisms at a-Si:H/c-Si interfaces by means of photoconductance measurements

C. Leendertz, N. Mingirulli, T. F. Schulze, J. P. Kleider, B. Rech, L. Korte
  • Applied Physics Letters, January 2011, American Institute of Physics
  • DOI: 10.1063/1.3590254