Effect of source-drain electric field on the Meyer–Neldel energy in organic field effect transistors

Mujeeb Ullah, A. Pivrikas, I. I. Fishchuk, A. Kadashchuk, P. Stadler, C. Simbrunner, N. S. Sariciftci, H. Sitter
  • Applied Physics Letters, January 2011, American Institute of Physics
  • DOI: 10.1063/1.3584131