The correlation between electric field emission phenomenon and Schottky contact reverse bias characteristics in nanostructured systems

J. Yu, J. Liu, M. Breedon, M. Shafiei, H. Wen, Y. X. Li, W. Wlodarski, G. Zhang, K. Kalantar-zadeh
  • Journal of Applied Physics, January 2011, American Institute of Physics
  • DOI: 10.1063/1.3583658
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