Hall effect-induced acceleration of electromigration failures in spin valve multilayers under magnetic field

  • Jing Jiang, Ding Gui Zeng, Kyung-Won Chung, Jongryoul Kim, Seongtae Bae
  • Applied Physics Letters, April 2011, American Institute of Physics
  • DOI: 10.1063/1.3581042

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http://dx.doi.org/10.1063/1.3581042

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