Time-temperature dependence of positive gate bias stress and recovery in amorphous indium-gallium-zinc-oxide thin-film-transistors

  • Md Delwar Hossain Chowdhury, Piero Migliorato, Jin Jang
  • Applied Physics Letters, April 2011, American Institute of Physics
  • DOI: 10.1063/1.3580611

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http://dx.doi.org/10.1063/1.3580611

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