Direct observation of basal-plane to threading-edge dislocation conversion in 4H-SiC epitaxy

Suk Chung, Virginia Wheeler, Rachael Myers-Ward, Charles R. Eddy, D. Kurt Gaskill, Ping Wu, Yoosuf N. Picard, Marek Skowronski
  • Journal of Applied Physics, January 2011, American Institute of Physics
  • DOI: 10.1063/1.3579447
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