Extraction of trap location and energy from random telegraph noise in amorphous TiO[sub x] resistance random access memories

Jung-Kyu Lee, Ju-Wan Lee, Jinwon Park, Sung-Woong Chung, Jae Sung Roh, Sung-Joo Hong, Il-whan Cho, Hyuck-In Kwon, Jong-Ho Lee
  • Applied Physics Letters, January 2011, American Institute of Physics
  • DOI: 10.1063/1.3575572