Nature of interface traps in Ge metal-insulator-semiconductor structures with GeO2 interfacial layers

Noriyuki Taoka, Wataru Mizubayashi, Yukinori Morita, Shinji Migita, Hiroyuki Ota, Shinichi Takagi
  • Journal of Applied Physics, January 2011, American Institute of Physics
  • DOI: 10.1063/1.3575332