Low energy electron beam induced damage on InGaN/GaN quantum well structure

H. Nykänen, P. Mattila, S. Suihkonen, J. Riikonen, E. Quillet, E. Homeyer, J. Bellessa, M. Sopanen
  • Journal of Applied Physics, January 2011, American Institute of Physics
  • DOI: 10.1063/1.3574655
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