Electrode dependence of filament formation in HfO2 resistive-switching memory

Kuan-Liang Lin, Tuo-Hung Hou, Jiann Shieh, Jun-Hung Lin, Cheng-Tung Chou, Yao-Jen Lee
  • Journal of Applied Physics, January 2011, American Institute of Physics
  • DOI: 10.1063/1.3567915