Dislocation density-dependent quality factors in InGaN quantum dot containing microdisks

  • H. A. R. El-Ella, F. Rol, M. J. Kappers, K. J. Russell, E. L. Hu, R. A. Oliver
  • Applied Physics Letters, March 2011, American Institute of Physics
  • DOI: 10.1063/1.3567545

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http://dx.doi.org/10.1063/1.3567545

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