Raman monitoring of semiconductor growth

V. Wagner, D. Drews, N. Esser, D. R. T. Zahn, J. Geurts, W. Richter
  • Journal of Applied Physics, June 1994, American Institute of Physics
  • DOI: 10.1063/1.356644

The authors haven't finished explaining this publication. If you are the author, sign in to claim or explain your work.

Read Publication

http://dx.doi.org/10.1063/1.356644

The following have contributed to this page: Professor Dietrich RT Zahn