Focused ion beam patterned Fe thin films: A study by selective area Stokes polarimetry and soft x-ray microscopy

P. J. Cook, T. H. Shen, P. J. Grundy, M.-Y. Im, P. Fischer, S. A. Morton, A. L. D. Kilcoyne
  • Journal of Applied Physics, January 2011, American Institute of Physics
  • DOI: 10.1063/1.3565049