Simultaneous imaging of the topography and dynamic properties of nanomechanical systems by optical beam deflection microscopy

P. M. Kosaka, J. Tamayo, E. Gil-Santos, J. Mertens, V. Pini, N. F. Martínez, O. Ahumada, M. Calleja
  • Journal of Applied Physics, January 2011, American Institute of Physics
  • DOI: 10.1063/1.3561812
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