SiO2/Si interfaces on high-index surfaces: Re-evaluation of trap densities and characterization of bonding structures

  • Shoichi Ogata, Shinya Ohno, Masatoshi Tanaka, Takahiro Mori, Tsuyoshi Horikawa, Tetsuji Yasuda
  • Applied Physics Letters, February 2011, American Institute of Physics
  • DOI: 10.1063/1.3561741

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http://dx.doi.org/10.1063/1.3561741

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