Determination of band offsets in strained InAsxP1−x/InP quantum well by capacitance voltage profile and photoluminescence spectroscopy

V. K. Dixit, S. D. Singh, S. Porwal, Ravi Kumar, Tapas Ganguli, A. K. Srivastava, S. M. Oak
  • Journal of Applied Physics, January 2011, American Institute of Physics
  • DOI: 10.1063/1.3561495