Resistive switching effects in single metallic tunneling junction with nanometer-scale gap

  • Takahiro Mizukami, Yuji Miyato, Kei Kobayashi, Kazumi Matsushige, Hirofumi Yamada
  • Applied Physics Letters, February 2011, American Institute of Physics
  • DOI: 10.1063/1.3559612

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http://dx.doi.org/10.1063/1.3559612

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