Characterization of microstructural defects in melt grown ZnO single crystals

W. Anwand, G. Brauer, R. I. Grynszpan, T. E. Cowan, D. Schulz, D. Klimm, J. Čižek, J. Kuriplach, I. Procházka, C. C. Ling, A. B. Djurišić, V. Klemm, G. Schreiber, D. Rafaja
  • Journal of Applied Physics, January 2011, American Institute of Physics
  • DOI: 10.1063/1.3559264
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