Measurement of hard x-ray lens wavefront aberrations using phase retrieval

Manuel Guizar-Sicairos, Suresh Narayanan, Aaron Stein, Meredith Metzler, Alec R. Sandy, James R. Fienup, Kenneth Evans-Lutterodt
  • Applied Physics Letters, January 2011, American Institute of Physics
  • DOI: 10.1063/1.3558914