Atomic-scale origins of bias-temperature instabilities in SiC–SiO[sub 2] structures

Xiao Shen, En Xia Zhang, Cher Xuan Zhang, Daniel M. Fleetwood, Ronald D. Schrimpf, Sarit Dhar, Sei-Hyung Ryu, Sokrates T. Pantelides
  • Applied Physics Letters, January 2011, American Institute of Physics
  • DOI: 10.1063/1.3554428