I-V measurement of NiO nanoregion during observation by transmission electron microscopy

Takashi Fujii, Masashi Arita, Kouichi Hamada, Hirofumi Kondo, Hiromichi Kaji, Yasuo Takahashi, Masahiro Moniwa, Ichiro Fujiwara, Takeshi Yamaguchi, Masaki Aoki, Yoshinori Maeno, Toshio Kobayashi, Masaki Yoshimaru
  • Journal of Applied Physics, January 2011, American Institute of Physics
  • DOI: 10.1063/1.3553868