Scanning microwave microscopy and scanning capacitance microscopy on colloidal nanocrystals

I. Humer, O. Bethge, M. Bodnarchuk, M. Kovalenko, M. Yarema, W. Heiss, H. P. Huber, M. Hochleitner, P. Hinterdorfer, F. Kienberger, J. Smoliner
  • Journal of Applied Physics, January 2011, American Institute of Physics
  • DOI: 10.1063/1.3553867